Ebook Info
- Published: 2002
- Number of pages: 458 pages
- Format: PDF
- File Size: 33.05 MB
- Authors: S. Morita
Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Free Download Noncontact Atomic Force Microscopy (NanoScience and Technology) 2002nd Edition in PDF format
Noncontact Atomic Force Microscopy (NanoScience and Technology) 2002nd Edition PDF Free Download
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Noncontact Atomic Force Microscopy (NanoScience and Technology) 2002nd Edition 2002 PDF Free Download
Download Noncontact Atomic Force Microscopy (NanoScience and Technology) 2002nd Edition PDF
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