Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) by Ludwig Reimer (PDF)

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Ebook Info

  • Published: 2010
  • Number of pages: 543 pages
  • Format: PDF
  • File Size: 19.41 MB
  • Authors: Ludwig Reimer

Description

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

User’s Reviews

Editorial Reviews: Review “…this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM.” T Mulvey, Measurement Science and Technology. 11, No12, December 2000 From the Back Cover Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Reviews from Amazon users which were colected at the time this book was published on the website:

⭐This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physicsfor wide range of readers.I recommend it.

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Keywords

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Download Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45) PDF
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