Reliability Physics and Engineering: Time-To-Failure Modeling by J. W. McPherson (PDF)

Description

“Reliability Physics and Engineering” provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. “Reliability Physics and Engineering” is a useful resource for students, engineers, and materials scientists.

User’s Reviews

Editorial Reviews: From the Back Cover Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.Key features include: · Materials/Device Degradation· Degradation Kinetics· Time-To-Failure Modeling· Statistical Tools· Failure-Rate Modeling· Accelerated Testing· Ramp-To-Failure Testing· Important Failure Mechanisms for Integrated Circuits· Important Failure Mechanisms for Mechanical Components· Conversion of Dynamic Stresses into Static Equivalents· Small Design Changes Producing Major Reliability Improvements· Screening Methods · Heat Generation and Dissipation· Sampling Plans and Confidence Intervals This textbook includes numerous example problems with solutions. Also, exercise problems along with the answers are included at the end of each chapter. Reliability Physics and Engineering can be a very useful resource for students, engineers, and materials scientists. About the Author Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.

Reviews from Amazon users which were colected at the time this book was published on the website:

⭐The second edition has great color illustrations. This is a no-nonsense presentation of Reliabilty Physiscs, Statistical Distributions, etc. I would only wish for a more in-depth analysis of how to use Weibull or Log-normal distributions to for area scaling, and detailed comparisons of different wear-out distributions. It is an excellent text.

⭐In terms of tutorial on the physics/kinetics of failure, Joe’s book is top notch, probably the best around. Probability and statistics coverage is not his strongest point overall. For that scope I would recommend Tobias and Trindade or Meeker. Meeker in particular is the benchmark on statistics for reliability.

⭐Excellent book as I had gained a lot of knowledge from it, although there could be improvements. Overall this is the best book I have found on reliability since Dr. McPherson gives examples showing you how to work reliability problems followed by problems with answers. In contrast, other books just give problems without answers. I found the book somewhat easy to follow; but it may be difficult for some new students to follow.

⭐It is my first review and want to show how I disappointed on this title.I bought this book because of the topics it covered which attract me to learn more deep in physic of failure in electronic and its models. The illustration in the book are good.What I really disappointed for the Kindle version is the table of content is not clickable. It is hard to jump to specific topic in interest. Second, some equations are found disappeared, e.g. 11.2, 11.3, 11.4 and so on. Not sure how many equations are lost in other chapter.All I expect is a fixed version for best reading experience.I am using the Android Kindle version 3.8.2.4

⭐The book is excellent (actually worth 6 stars). It provides a large number of worked examples in every chapter. It covers a wide range of engineering/physics problems and does the solutions using a variety of mathematical methods. Even if you are not really interested in the underlying physics example he still grabs your attention and shows you how to solve similar type problems elsewhere.I wish I owned it.Braam Botha

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